Low-dropout regulator with modest ripple and rugged performance in 180nm

Sreehari Rao Patri; Krishnaprasad K. S. R.; Suresh Alapati; Rajeshwar Rao

doi:10.1117/12.2012306

28 January 2013 Low-dropout regulator with modest ripple and rugged performance in 180nm

Sreehari Rao Patri, Krishnaprasad K. S. R., Suresh Alapati, Rajeshwar Rao

Proceedings Volume 8760, International Conference on Communication and Electronics System Design; 87601J (2013) https://doi.org/10.1117/12.2012306
Event: International Conference on Communication and Electronics System Design, 2013, Jaipur, India

Abstract

Low-dropout (LDO) regulator with modest ripple and improved transient response is implemented in 0.18μm CMOS technology. The proposed regulator for SOC application can achieve high stability for load current from zero to 100mA. This LDO uses process, temperature independent biasing for error amplifier which makes LDO temperature and process independent. The experimental results show the load regulation of 162 μV/mA and line regulation of 0.9 mV/V. The whole LDO chip consumes a quiescent current of 50 μA with an ultra low dropout voltage of 200mV at the maximum output current of 100mA.

Citation Download Citation

Sreehari Rao Patri, Krishnaprasad K. S. R., Suresh Alapati, and Rajeshwar Rao "Low-dropout regulator with modest ripple and rugged performance in 180nm", Proc. SPIE 8760, International Conference on Communication and Electronics System Design, 87601J (28 January 2013); https://doi.org/10.1117/12.2012306

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