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1 March 1989 Interferometry On Wolter X-Ray Optics: A Possible Approach
Josenh M. Geary
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Optical Engineering, Vol. 28, Issue 3, 283217 (March 1989). https://doi.org/10.1117/12.7976937
Abstract
A novel interferometric approach for obtaining surface interferograms on Wolter-type optics is presented. A subaperture simulation experiment shows the data analysis steps required. A second, independent test basically confirms the simulation results. Splicing of the subaperture interferograms around the circumference is discussed.
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Josenh M. Geary "Interferometry On Wolter X-Ray Optics: A Possible Approach," Optical Engineering 28(3), 283217 (1 March 1989). https://doi.org/10.1117/12.7976937
Published: 1 March 1989
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Cited by 1 scholarly publication and 8 patents.
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KEYWORDS
Interferometry
X-ray optics
Data analysis
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