Andrey A. Lomov
at Ioffe Institute
SPIE Involvement:
Author
Publications (6)

PROCEEDINGS ARTICLE | December 30, 2016
Proc. SPIE. 10224, International Conference on Micro- and Nano-Electronics 2016
KEYWORDS: Annealing, Crystals, X-rays, Ions, Silicon, Reflectivity, Atomic force microscopy, Transmission electron microscopy, Helium, Plasma

PROCEEDINGS ARTICLE | January 8, 2013
Proc. SPIE. 8700, International Conference Micro- and Nano-Electronics 2012
KEYWORDS: Diffraction, Reflection, Scattering, Etching, Crystals, X-rays, X-ray diffraction, Gallium arsenide, Scanning electron microscopy, Transmission electron microscopy

PROCEEDINGS ARTICLE | June 10, 2006
Proc. SPIE. 6260, Micro- and Nanoelectronics 2005
KEYWORDS: Quantum wells, Second-harmonic generation, Spectroscopy, X-rays, Interfaces, Silicon, Interferometry, Reflectometry, Geometrical optics, Anisotropy

PROCEEDINGS ARTICLE | June 10, 2006
Proc. SPIE. 6260, Micro- and Nanoelectronics 2005
KEYWORDS: Diffraction, Quantum wells, Data modeling, Scattering, Chemical species, Crystals, X-rays, X-ray diffraction, Heterojunctions, Crystallography

PROCEEDINGS ARTICLE | June 10, 2006
Proc. SPIE. 6260, Micro- and Nanoelectronics 2005
KEYWORDS: Diffraction, Quantum wells, Scattering, Luminescence, Crystals, X-rays, X-ray diffraction, Interfaces, Gallium arsenide, Heterojunctions

PROCEEDINGS ARTICLE | May 28, 2004
Proc. SPIE. 5401, Micro- and Nanoelectronics 2003
KEYWORDS: Diffraction, Quantum wells, Scattering, Crystals, X-ray diffraction, Interfaces, Gallium arsenide, Silicon, Solids, Heterojunctions

Showing 5 of 6 publications
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