Anthony Torres
at
SPIE Involvement:
Author
Publications (2)

SPIE Journal Paper | March 17, 2014
OE Vol. 53 Issue 03
KEYWORDS: ZBLAN, Crystals, Glasses, Temperature metrology, Annealing, Silica, Optical engineering, Photomicroscopy, Optical microscopy, Microscopy

PROCEEDINGS ARTICLE | June 18, 2013
Proc. SPIE. 8704, Infrared Technology and Applications XXXIX
KEYWORDS: Silica, Glasses, Annealing, Microscopy, Crystals, Ions, Transmission electron microscopy, Neodymium, ZBLAN, Temperature metrology

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