Attilio Bruno Veratti
at ICON Tecnologia
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 15 March 2002 Paper
Edson Verdini, Attilio Veratti
Proceedings Volume 4710, (2002) https://doi.org/10.1117/12.459582
KEYWORDS: Inspection, Temperature metrology, Safety, Statistical analysis, Infrared radiation, Thermography, Internet, Standards development, Switches, Capacitors

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