Dr. Charles L. Joseph
Associate Research Professor at Rutgers The State Univ of New Jersey
SPIE Involvement:
Author
Publications (14)

PROCEEDINGS ARTICLE | February 7, 2009
Proc. SPIE. 7212, Optical Components and Materials VI
KEYWORDS: Photodetectors, Sensors, Electrodes, Photomultipliers, Electrons, Magnetism, Physics, Distortion, Spatial resolution, Spherical lenses

PROCEEDINGS ARTICLE | September 12, 2007
Proc. SPIE. 6660, Infrared Systems and Photoelectronic Technology II
KEYWORDS: Refractive index, Mirrors, Silica, Reflection, Ultraviolet radiation, Interfaces, Quantum efficiency, Reflectivity, Antimony, Absorption

PROCEEDINGS ARTICLE | June 12, 2001
Proc. SPIE. 4288, Photodetectors: Materials and Devices VI
KEYWORDS: Astronomy, Diamond, Magnesium, Sensors, Ultraviolet radiation, Silicon, Quantum efficiency, Platinum, Gallium nitride, Ultraviolet astronomy

PROCEEDINGS ARTICLE | November 25, 1999
Proc. SPIE. 3764, Ultraviolet and X-Ray Detection, Spectroscopy, and Polarimetry III
KEYWORDS: Near ultraviolet, Sensors, Ultraviolet radiation, Microchannel plates, Quantum efficiency, Lamps, Gallium nitride, Charge-coupled devices, Ultraviolet detectors, UV optics

PROCEEDINGS ARTICLE | November 25, 1999
Proc. SPIE. 3764, Ultraviolet and X-Ray Detection, Spectroscopy, and Polarimetry III
KEYWORDS: Spectrographs, Sensors, Calibration, Spectroscopy, Ultraviolet radiation, Microchannel plates, Image resolution, Imaging spectroscopy, Space telescopes, Spectral resolution

PROCEEDINGS ARTICLE | August 28, 1998
Proc. SPIE. 3356, Space Telescopes and Instruments V
KEYWORDS: Diffractive optical elements, Sensors, Microchannel plates, Image resolution, Amplifiers, Power supplies, Control systems, Spatial resolution, Analog electronics, Temperature metrology

Showing 5 of 14 publications
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