Chun-Tse Chang
at WIN Semiconductors Corp.
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 15 March 2023 Presentation + Paper
Proceedings Volume 12439, 124390I (2023) https://doi.org/10.1117/12.2648254
KEYWORDS: Vertical cavity surface emitting lasers, Semiconducting wafers, Internal quantum efficiency, Reliability, Oxidation, Oxides, Semiconductors, Gallium arsenide, Three dimensional sensing, Quantum processes

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