David Squires
at ALLVAR
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 18 November 2019 Presentation
James Monroe, Jeremy McAllister, Jay Zgarba, David Squires, John Deegan
Proceedings Volume 11175, 111750R (2019) https://doi.org/10.1117/12.2536862
KEYWORDS: Infrared radiation, Temperature metrology, Refraction, Infrared imaging, Metals, Optomechanical design, Optical design, Visible radiation

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