Mr. Dongmin Yang
Camera Engineer at Apple Inc
SPIE Involvement:
Senior status | Conference Program Committee | Author
Area of Expertise:
miniature optical design , borescope imaging , endoscope
Publications (2)

PROCEEDINGS ARTICLE | May 19, 2016
Proc. SPIE. 9868, Dimensional Optical Metrology and Inspection for Practical Applications V
KEYWORDS: Signal to noise ratio, Optical filters, Metrology, Lithium, Light emitting diodes, Optical sensors, Polarization, Reflection, Speckle, Interferometers, Cameras, Sensors, Inspection, Reflectivity, Semiconductor lasers, 3D metrology, Projection systems, Neodymium, 3D vision, Structured light

PROCEEDINGS ARTICLE | November 26, 2012
Proc. SPIE. 8557, Optical Design and Testing V
KEYWORDS: Optical design, Video, Inspection, Distortion, Lens design, Endoscopes, Image quality, Dysprosium, Zoom lenses, Modulation transfer functions

Conference Committee Involvement (1)
Dimensional Optical Metrology and Inspection for Practical Applications VIII
14 April 2019 | Baltimore, Maryland, United States
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