Edward H. Kist
at NASA Langley Research Ctr
SPIE Involvement:
Publications (7)

Proceedings Article | 18 April 2006 Paper
Michael Gazarik, Dave Johnson, Ed Kist, Frank Novak, Charles Antill, David Haakenson, Patricia Howell, John Pandolf, Rusty Jenkins, Rusty Yates, Ryan Stephan, Doug Hawk, Michael Amoroso
Proceedings Volume 6205, 62051C (2006) https://doi.org/10.1117/12.669683
KEYWORDS: Cameras, Infrared cameras, Imaging systems, Inspection, Infrared imaging, Thermography, Electronic components, Manufacturing, Thermal modeling, Infrared radiation

Proceedings Article | 28 March 2005 Paper
Michael Gazarik, Charles Antill, David Johnson, Ryan Stephan, Kevin Vipavetz, John Pandolf, Edward Kist, Nina Tappan, William Winfree, John Teter, David Haakenson, David Hinds, Brian Backer, Heather Wickman, Michael Harris
Proceedings Volume 5782, (2005) https://doi.org/10.1117/12.603167
KEYWORDS: Cameras, Infrared cameras, Inspection, Infrared imaging, Imaging systems, Electronics, Staring arrays, Sensors, Thermography, Visible radiation

Proceedings Article | 22 December 2004 Paper
Joel Levine, Vincent Ambrosia, James Brass, Richard Davis, Charles Dull, Paul Greenfield, F. Harrison, Brian Killough, Edward Kist, Joseph Pinto, Gregory Stover, Nina Tappan, Steve Wegener
Proceedings Volume 5661, (2004) https://doi.org/10.1117/12.580312
KEYWORDS: Combustion, Atmospheric modeling, Atmospheric particles, Data modeling, Unmanned aerial vehicles, Phase modulation, Remote sensing, Flame detectors, Satellites, Sensors

Proceedings Article | 28 December 1999 Paper
Ira Sorensen, J. Robert Mahan, Mamadou Barry, Edward Kist
Proceedings Volume 3870, (1999) https://doi.org/10.1117/12.373176
KEYWORDS: Sensors, Resistance, Genetic algorithms, Thermal modeling, Optimization (mathematics), Carbon, Capacitance, Error analysis, Prototyping, Temperature metrology

Proceedings Article | 21 December 1998 Paper
J. Robert Mahan, Stephanie Weckmann, Maria Sanchez, Ira Sorensen, Katherine Coffey, Edward Kist, Edward Nelson
Proceedings Volume 3498, (1998) https://doi.org/10.1117/12.333631
KEYWORDS: Sensors, Diffraction, Thermal modeling, Thermography, Reflection, Absorption, Finite element methods, Data modeling, Far-field diffraction, Optical design

Showing 5 of 7 publications
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