Elmer Wang
at Wayne State Univ
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 19 September 2013 Paper
Proceedings Volume 8818, 881805 (2013) https://doi.org/10.1117/12.2023488
KEYWORDS: Glasses, Nanoparticles, Etching, Nanostructures, Reflectivity, Refractive index, Photomasks, Lithography, Coating, Atomic force microscopy

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