Mr. Elmer Wang
at Wayne State Univ
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | September 19, 2013
Proc. SPIE. 8818, Nanostructured Thin Films VI
KEYWORDS: Lithography, Nanostructures, Refractive index, Nanoparticles, Etching, Glasses, Coating, Reflectivity, Atomic force microscopy, Photomasks

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