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Enxiao Liu
at Harbin Institute of Technology
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Publications (1)
Proceedings Article | 7 March 2019 Paper
Equivalent thin film model with complex refractive index of resonant micromesh
Yongmeng Liu, Xv Liu , Zelin Li, Chuanzhi Sun , Enxiao Liu
Proceedings Volume 11053, 110534U (2019) https://doi.org/10.1117/12.2521224
KEYWORDS: Resistance, Coating, Refractive index, Thin films, Electromagnetic coupling, Transmittance, Thin film coatings, Metals, Performance modeling, Electromagnetic interference
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