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Hagen Saemrow
at Univ Rostock
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Publications (1)
Proceedings Article | 28 May 2009 Paper
Automated insertion of twin gates to improve reliability concerning gate oxide breakdown
Hagen Saemrow, Claas Cornelius, Frank Sill, Andreas Tockhorn, Dirk Timmermann
Proceedings Volume 7363, 736310 (2009) https://doi.org/10.1117/12.821711
KEYWORDS: Transistors, Reliability, Oxides, Logic, Switching, Integrated circuits, Manufacturing, Integrated circuit design, System integration, Computer aided design
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