Mr. Jan Václavík
at Institute of Plasma Physics ASCR vvi
SPIE Involvement:
Author
Publications (15)

PROCEEDINGS ARTICLE | November 11, 2016
Proc. SPIE. 10151, Optics and Measurement International Conference 2016
KEYWORDS: Thin films, Ferroelectric materials, Sputter deposition, Annealing, Crystals, Ions, Silicon, Oxygen, Ion beams, Perovskite

PROCEEDINGS ARTICLE | November 11, 2016
Proc. SPIE. 10151, Optics and Measurement International Conference 2016
KEYWORDS: Thin films, Silica, Optical coatings, Surface roughness, Humidity, Spectroscopic ellipsometry, Sol-gels, Thin film coatings, Precision optics, Liquids

PROCEEDINGS ARTICLE | November 11, 2016
Proc. SPIE. 10151, Optics and Measurement International Conference 2016
KEYWORDS: Refractive index, Holography, Ferroelectric materials, Digital holography, Crystals, Wavefronts, Numerical simulations, Tomography, 3D metrology, Electro optics

PROCEEDINGS ARTICLE | November 11, 2016
Proc. SPIE. 10151, Optics and Measurement International Conference 2016
KEYWORDS: Thin films, Ferroelectric materials, Argon, Sputter deposition, Annealing, Crystals, Ions, Ion beams, Lead, Perovskite

PROCEEDINGS ARTICLE | November 11, 2016
Proc. SPIE. 10151, Optics and Measurement International Conference 2016
KEYWORDS: Modeling, Antireflective coatings, Quartz, Glasses, Error analysis, Coating, Reflectivity, Ion beams, Transmittance, Tantalum

PROCEEDINGS ARTICLE | November 11, 2016
Proc. SPIE. 10151, Optics and Measurement International Conference 2016
KEYWORDS: Speckle, Cameras, Sensors, Image restoration, Imaging spectroscopy, Computer programming, Speckle pattern, Relays, Laser spectroscopy, Compressed sensing

Showing 5 of 15 publications
SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Back to Top