Jianrong Ren
at Beijing Institute of Technology
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | September 2, 2003
Proc. SPIE. 5253, Fifth International Symposium on Instrumentation and Control Technology
KEYWORDS: Statistical analysis, Optical spheres, Interferometers, Laser applications, Laser development, Time metrology, Data processing, Process control, Statistical modeling, Standards development

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