Dr. Jonathan Schuster
Electronics Engineer at U.S. Army Research Laboratory
SPIE Involvement:
Author
Area of Expertise:
infrared detectors , physics of semiconductor devices
Profile Summary

Jonathan Schuster received a B.S. degree in physics and a minor in computer science from the University at Buffalo in 2010, a M.S. degree in electrical engineering from Boston University in 2013 and a Ph.D. degree in electrical engineering from Boston University in 2014.

Research interests include modeling fiber optic systems and semiconductor devices. He has extensively modeled infrared photovoltaic pixel arrays incorporating advanced micro-structured characteristics for improved device performance. He is also experienced in developing new hybridization techniques to hybridize pixel arrays to ROICs.
Publications (13)

PROCEEDINGS ARTICLE | May 9, 2018
Proc. SPIE. 10624, Infrared Technology and Applications XLIV

PROCEEDINGS ARTICLE | February 23, 2018
Proc. SPIE. 10526, Physics and Simulation of Optoelectronic Devices XXVI
KEYWORDS: Infrared imaging, Finite-difference time-domain method, Gaussian beams, Imaging systems, Sensors, Diffusion, Numerical simulations, Computer simulations, 3D modeling, Modulation transfer functions

PROCEEDINGS ARTICLE | January 26, 2018
Proc. SPIE. 10540, Quantum Sensing and Nano Electronics and Photonics XV
KEYWORDS: Staring arrays, Long wavelength infrared, Semiconductors, Mercury cadmium telluride, Scattering, Semiconductor materials, Light scattering, Measurement devices, Superlattices, Instrument modeling

PROCEEDINGS ARTICLE | January 30, 2017
Proc. SPIE. 10111, Quantum Sensing and Nano Electronics and Photonics XIV
KEYWORDS: Long wavelength infrared, Semiconductors, Infrared sensors, Mercury cadmium telluride, Sensors, Semiconductor materials, Infrared technology, Stereolithography, Laser sintering, Instrument modeling

PROCEEDINGS ARTICLE | September 26, 2016
Proc. SPIE. 9933, Optical Sensing, Imaging, and Photon Counting: Nanostructured Devices and Applications 2016
KEYWORDS: Semiconductors, Infrared sensors, Sensors, Semiconductor materials, Diffusion, Computer simulations, 3D modeling, Modulation transfer functions, Laser sintering, Instrument modeling

PROCEEDINGS ARTICLE | June 17, 2016
Proc. SPIE. 9819, Infrared Technology and Applications XLII
KEYWORDS: Infrared detectors, Long wavelength infrared, Mercury cadmium telluride, Cadmium, Sensors, Electrons, Diffusion, Doping, Heterojunctions, Instrument modeling

Showing 5 of 13 publications
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