Justin J. Henrie
at Brigham Young Univ
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | August 18, 2005
Proc. SPIE. 5878, Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies II
KEYWORDS: Thin films, Light sources, Continuous wave operation, Light emitting diodes, Error analysis, Reflectivity, Reflectometry, Reflectance spectroscopy, Semiconducting wafers, Spectroscopes

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