Kevin Laurent
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 12 June 2023 Poster + Paper
Proceedings Volume 12536, 1253613 (2023) https://doi.org/10.1117/12.2664113
KEYWORDS: Thermography, Data modeling, Thermal modeling, Image segmentation, Defect detection, Image processing, Inspection, Deep learning, Simulations

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