Dr. Louis-Philippe Carignan
at National research council
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 11 March 2024 Presentation + Paper
Maxime Rivard, Marc Palardy-Sim, Steven Roy, Gil Lund, Matthew Zupan, Mark Benson, Christian Padioleau, André Beauchesne, Louis-Philippe Carignan, Ali Yousefpour, Guy Lamouche
Proceedings Volume 12893, 128930O (2024) https://doi.org/10.1117/12.3002630
KEYWORDS: Manufacturing, Head, Inspection, Fabrication, Optical coherence tomography, Distance measurement, Reflectivity, Reflection, Industry, System integration

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top