Dr. Manuel J. Mestre
at Ecole normale superieure Paris-Saclay
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | June 18, 2007
Proc. SPIE. 6616, Optical Measurement Systems for Industrial Inspection V
KEYWORDS: Photovoltaics, Fringe analysis, Metrology, Interferometers, Interferometry, Wavefronts, Monte Carlo methods, Turbulence, Reconstruction algorithms, Phase shifts

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Back to Top