Ms. Ming Lee
at Huettinger Electronic Inc
SPIE Involvement:
Author
Publications (6)

PROCEEDINGS ARTICLE | February 25, 2008
Proc. SPIE. 6898, Silicon Photonics III
KEYWORDS: Fabry–Perot interferometers, Methane, Waveguides, Silicon, Semiconductor lasers, Raman spectroscopy, Diodes, Laser damage threshold, Silicon photonics, Absorption

PROCEEDINGS ARTICLE | February 12, 2008
Proc. SPIE. 6896, Integrated Optics: Devices, Materials, and Technologies XII
KEYWORDS: Tunable lasers, Resonators, Waveguides, Polarization, Silicon, Laser applications, Semiconductor lasers, Raman spectroscopy, Laser resonators, Directional couplers

PROCEEDINGS ARTICLE | October 20, 2006
Proc. SPIE. 6349, Photomask Technology 2006
KEYWORDS: Lithography, Finite-difference time-domain method, Polarization, Inspection, Chromium, Printing, Photomasks, Immersion lithography, Optical proximity correction, SRAF

PROCEEDINGS ARTICLE | August 30, 2006
Proc. SPIE. 6322, Tuning the Optic Response of Photonic Bandgap Structures III
KEYWORDS: Refractive index, Proteins, Biosensing, Sensors, Molecules, Silicon, Biosensors, Photonic crystals, Molecular biology, Optical microcavities

PROCEEDINGS ARTICLE | September 13, 2005
Proc. SPIE. 5926, Tuning the Optical Response of Photonic Bandgap Structures II
KEYWORDS: Refractive index, Mirrors, Biosensing, Sensors, Silicon, Coating, Reflectivity, Biosensors, Scanning electron microscopy, Optical microcavities

PROCEEDINGS ARTICLE | October 14, 2004
Proc. SPIE. 5511, Tuning the Optical Response of Photonic Bandgap Structures
KEYWORDS: Oxides, Refractive index, Mirrors, Silicon, Reflectivity, Photonic crystals, Control systems, Optical microcavities, Temperature metrology, Oxidation

Showing 5 of 6 publications
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