Niklas Arndt
at Univ Münster
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 17 March 2023 Presentation
Proceedings Volume PC12431, PC124310I (2023) https://doi.org/10.1117/12.2650827
KEYWORDS: Dielectric polarization, Structured light, Digital holography, 3D metrology, Shape analysis, Self-assembled monolayers, Microscopy, Metrology, Holography, Dielectrics

Proceedings Article | 17 March 2023 Presentation
Eileen Otte, Hyounghan Kwon, Nicholas Güsken, Niklas Arndt, Bart Jan Ravoo, Mark Brongersma
Proceedings Volume PC12436, PC124360K (2023) https://doi.org/10.1117/12.2650590
KEYWORDS: Dielectric polarization, Structured light, Digital holography, 3D metrology, Shape analysis, Self-assembled monolayers, Microscopy, Metrology, Holography, Dielectrics

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