Robert van de Laar
at SCIL Nanoimprint Solutions
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 10 April 2024 Presentation
Marc Verschuuren, Bradley Williams, Mohammad Ramezani, Robert van de Laar, Jeroen Visser, Gert-Jan Hurxkens, Rob Voorkamp
Proceedings Volume PC12956, PC1295609 (2024) https://doi.org/10.1117/12.3003683
KEYWORDS: Semiconducting wafers, Nanoimprint lithography, Nanophotonics, Wafer-level optics, Scatterometry, Refractive index, Optical alignment, Metalenses, Etching, Reproducibility

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