Dr. Taeho Ha
at Korea Institute of Machinery & Materials
SPIE Involvement:
Conference Co-Chair | Author
Publications (5)

PROCEEDINGS ARTICLE | November 17, 2008
Proc. SPIE. 7266, Optomechatronic Technologies 2008
KEYWORDS: Interferometers, Calibration, Error analysis, Manufacturing, Image resolution, CCD cameras, Pixel resolution, Machine vision, Standards development, Laser systems engineering

SPIE Conference Volume | December 5, 2005

PROCEEDINGS ARTICLE | October 25, 2004
Proc. SPIE. 5603, Machine Vision and its Optomechatronic Applications
KEYWORDS: Fringe analysis, Optical spheres, Data modeling, Cameras, Calibration, LCDs, Image sensors, 3D metrology, Projection systems, CCD image sensors

PROCEEDINGS ARTICLE | October 8, 2004
Proc. SPIE. 5662, Fifth International Symposium on Laser Precision Microfabrication
KEYWORDS: Light sources, Optical lithography, LCDs, Solids, Microfabrication, Computer aided design, 3D displays, Rapid manufacturing, Stereolithography, Liquids

Conference Committee Involvement (2)
Optomechatronic Sensors and Instrumentation II
3 October 2006 | Boston, Massachusetts, United States
Optomechatronic Sensors and Instrumentation
5 December 2005 | Sapporo, Japan
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