Mr. Xin Zhang Profile

Xin Zhang

at Beijing Zhenxing Institute of Metrology and Measurement

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Proceedings Article | 29 December 2023 Paper

Research on on-orbit calibration source technology for space infrared load

Ziwei Xu, Xin Zhang, Jiapeng Wang, Wanglin Yang

Proceedings Volume 12976, 129761G (2023) https://doi.org/10.1117/12.3009251

KEYWORDS: Calibration, Temperature metrology, Infrared radiation, Infrared technology, Vacuum chambers, Black bodies, Infrared detectors, Platinum, Emissivity, Vacuum

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In recent years, with the development of infrared technology, the radiation value of targets can be quantitatively detected through radiation parameter calibration, making it possible for infrared payloads to determine the type of target based on the radiation value, greatly improving the detection ability of infrared payloads. To ensure the quantitative detection accuracy, it is necessary to calibrate the radiation parameters of the infrared load, accurately grasp the inversion coefficient of the infrared load, and ensure the inversion accuracy of the detection data. This article focuses on the urgent need for on orbit radiation calibration of infrared payloads, and conducts research on on orbit calibration sources based on memes technology. Through experimental verification, the on orbit calibration source, as the standard source for on orbit calibration of loads, can provide a stable infrared radiation and has the characteristics of wide temperature range and multiple calibration points, meeting the calibration requirements during the operation of infrared loads. The on orbit calibration source can serve as a spatial quantity reference to provide high quantitative calibration for infrared remote sensing payloads, laying a solid technical foundation for the next step of space infrared payloads and future development of China's infrared satellites.

Proceedings Article | 18 March 2021 Paper

Research on calibration technology of large-area array high-resolution optical load spectral response

Si-ting Zhai, Jia-peng Wang, Hong-sheng Sun, Xin Zhang

Proceedings Volume 11780, 117801L (2021) https://doi.org/10.1117/12.2590728

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Aiming at the key parameter measurement bottlenecks and urgent needs of high-resolution optical loads such as satellite panchromatic multi-spectral cameras, full-spectrum multi-modal imaging spectrometers, and high-resolution imaging spectrometers, a set of wide-spectrum super-large area array optical loads is designed The device was calibrated for key parameters of absolute spectral responsivity, and the measurement uncertainty of the device was evaluated. This device is mainly composed of a broad spectrum light source, monochromator, optical system, standard radiometer, two-dimensional control translation stage, scanning control system, data acquisition and integrated control system. The measurement range is a wide spectral band, 0.4μm～1.6μm, the measurement resolution can reach 10k×10k, and the measurement uncertainty of absolute spectral radiance responsivity is 3% (k=2) [radiance range: 0.1W/(sr∙m²)～10W/(sr∙ m²)]. Establish a set of absolute spectral responsivity calibration device for wide-spectrum super-large area array optical load to solve the technical problem that the key parameters of wide-spectrum high-resolution optical cameras cannot be calibrated in the process of development, debugging, scientific research and production, and provide high-resolution earth observation for my country Provide services for quantitative needs in engineering, military reconnaissance, marine monitoring, and meteorological monitoring.

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