Dr. Yasuaki Hori
at National Institute of Advanced Industrial Science and Technology
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 10 August 2023 Presentation + Paper
Proceedings Volume 12619, 1261909 (2023) https://doi.org/10.1117/12.2673712
KEYWORDS: Photomasks, Calibration, Microscopes, Interferometers, Edge detection, Ultraviolet radiation, Standards development, Imaging systems, CCD image sensors, Beam diameter

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