Mr. Xiaoyi Liu Profile

Xiaoyi Liu

at Xidian Univ

SPIE Involvement:

Author

Publications (1)

This will count as one of your downloads.

You will have access to both the presentation and article (if available).

DOWNLOAD NOW

This content is available for download via your institution's subscription. To access this item, please sign in to your personal account.

Email or Username Forgot your username?

Password Forgot your password?

Show

Keep me signed in

No SPIE account? Create an account

Proceedings Article | 8 November 2014 Paper

Analysis on the electromagnetic scattering properties of crops at multi-band

Tao Wu, Zhensen Wu, Xiaoyi Liu

Proceedings Volume 9260, 926041 (2014) https://doi.org/10.1117/12.2069235

KEYWORDS: Scattering, Vegetation, Dielectric polarization, Dielectrics, Microwave radiation, Backscatter, Polarization, Optical testing, Mineralogy, Electromagnetic scattering

Read Abstract +

The vector radiative transfer (VRT) theory for active microwave remote sensing and Rayleigh-Gans approximation (GRG) are applied in the study, and an iterative algorithm is used to solve the RT equations, thus we obtain the zeroorder and first-order equation for numerical results. The Michigan Microwave Canopy Scattering (MIMICS) model is simplified to adapt to the crop model, by analyzing body-surface bistatic scattering and backscattering properties between a layer of soybean or wheat consisting of stems and leaves and different underlying soil surface at multi-band (i.e. P, L, S, X, Ku-band), we obtain microwave scattering mechanisms of crop components and the effect of underlying ground on total crop scattering. Stem and leaf are regard as a needle and a circular disk, respectively. The final results are compared with some literature data to verify our calculating method, numerical results show multi-band crop microwave scattering properties differ from scattering angle, azimuth angle and moisture of vegetation and soil, which offer the part needed information for the design of future bistatic radar systems for crop sensing applications.

My Library

You currently do not have any folders to save your paper to! Create a new folder below.

Folder Name

Folder Description

View contact details

UPDATE YOUR PROFILE

Is this your profile? Update it now.

Sign into your SPIE.org account

Don’t have a profile and want one?

Create an account on SPIE.org

Access to the requested content is limited to institutions that have purchased or subscribe to SPIE eBooks. You are receiving this notice because your organization may not have SPIE eBooks access.*

*Shibboleth/Open Athens users─please sign in to access your institution's subscriptions.

To obtain this item, you may purchase the complete book in print or electronic format on SPIE.org.

ORGANIZATIONAL
Sign in with credentials provided by your organization.

Organizational Username

Organizational Password

Show/Hide Password

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available

Members:

Non-members: ADD TO CART

Keywords/Phrases

Search In:

Publication Years