PROCEEDINGS VOLUME 3423
SECOND GR-I INTERNATIONAL CONFERENCE ON NEW LASER TECHNOLOGIES AND APPLICATIONS | 1-4 JUNE 1997
Second GR-I International Conference on New Laser Technologies and Applications
SECOND GR-I INTERNATIONAL CONFERENCE ON NEW LASER TECHNOLOGIES AND APPLICATIONS
1-4 June 1997
Olympia, Greece
New Lasers Sources: Technology and Basic Research
Proc. SPIE 3423, Past, present, and future of laser technology, 0000 (14 July 1998); doi: 10.1117/12.316553
Proc. SPIE 3423, Diode-pumped all-solid state lasers: solutions for scientific, biomedical, and industrial applications, 0000 (14 July 1998); doi: 10.1117/12.316564
Proc. SPIE 3423, Diffusion-cooled radio-frequency-excited CO2 lasers, 0000 (14 July 1998); doi: 10.1117/12.316575
Proc. SPIE 3423, Hercules: an XeCl excimer laser facility for high-intensity irradiation experiments, 0000 (14 July 1998); doi: 10.1117/12.316586
Proc. SPIE 3423, Free-electron laser infrared facilities, 0000 (14 July 1998); doi: 10.1117/12.316597
Proc. SPIE 3423, Recoil-induced gain and collective atomic recoil laser, 0000 (14 July 1998); doi: 10.1117/12.316608
Proc. SPIE 3423, Rare-earth-doped active films: basic problems to solve and hints for solutions, 0000 (14 July 1998); doi: 10.1117/12.316619
Proc. SPIE 3423, ESPI-characterization of online deformations of CVD-diamond output coupler windows in high-power IR lasers, 0000 (14 July 1998); doi: 10.1117/12.316630
Proc. SPIE 3423, CW laser at 1.6 to 1.9 um through cascaded fiber Raman, 0000 (14 July 1998); doi: 10.1117/12.316638
Proc. SPIE 3423, Laser action from (B2E-X2E)HgBr induced by UV laser multiphoton dissociation of HgBr2: measurements and experimental results, 0000 (14 July 1998); doi: 10.1117/12.316554
Proc. SPIE 3423, Electrical characteristics of the discharge in a pulsed gas laser, 0000 (14 July 1998); doi: 10.1117/12.316555
Proc. SPIE 3423, Cathode roughness effects in a high-PRF long-pulse XeCl laser, 0000 (14 July 1998); doi: 10.1117/12.316556
Proc. SPIE 3423, Electron beam lithography on LiF films for integrated active optical waveguides, 0000 (14 July 1998); doi: 10.1117/12.316557
Semiconductor Lasers and Optoelectronics
Proc. SPIE 3423, Numerical modeling of long-wavelength vertical-cavity surface-emitting semiconductor lasers. I. Continuous-wave modeling, 0000 (14 July 1998); doi: 10.1117/12.316558
Proc. SPIE 3423, Numerical modeling of long-wavelength vertical-cavity surface-emitting semiconductor lasers. II. Transient thermal modeling, 0000 (14 July 1998); doi: 10.1117/12.316559
Proc. SPIE 3423, Design of a frequency converter based on a hybrid glass/polymer waveguide device, 0000 (14 July 1998); doi: 10.1117/12.316560
Proc. SPIE 3423, Development of a cost-effective fiber optic delay line, 0000 (14 July 1998); doi: 10.1117/12.316561
Proc. SPIE 3423, Optoelectronic indicator/warning circuit for detecting and observing the high values of incident optical radiation, 0000 (14 July 1998); doi: 10.1117/12.316562
Proc. SPIE 3423, Asymmetric multiple quantum well lasers and amplifiers, 0000 (14 July 1998); doi: 10.1117/12.316563
Proc. SPIE 3423, Laser parameters of n-i-p-i crystals, 0000 (14 July 1998); doi: 10.1117/12.316565
Proc. SPIE 3423, Optical self-homodyne coherent system using elliptically or circularly polarized laser light, 0000 (14 July 1998); doi: 10.1117/12.316566
Laser Beam Propagation and Space Control
Proc. SPIE 3423, Self-learning optical system based on a genetic-algorithm driven spatial light modulator, 0000 (14 July 1998); doi: 10.1117/12.316567
Proc. SPIE 3423, Generation of zero-order Bessel beams with Fabry-Perot interferometer, 0000 (14 July 1998); doi: 10.1117/12.316568
Proc. SPIE 3423, Laser beam quality characterization, 0000 (14 July 1998); doi: 10.1117/12.316569
Proc. SPIE 3423, Definition and measurement of the times-diffraction-limit number of high-power laser beams, 0000 (14 July 1998); doi: 10.1117/12.316570
Proc. SPIE 3423, Effects of time evolution of the laser beam parameters in Gaussian cavities, 0000 (14 July 1998); doi: 10.1117/12.316571
Proc. SPIE 3423, Measurement of the time-resolved divergence of pulsed laser beams, 0000 (14 July 1998); doi: 10.1117/12.316572
Proc. SPIE 3423, Spatial power distribution of a high-power CO2 laser beam: experimental study, 0000 (14 July 1998); doi: 10.1117/12.316573
Proc. SPIE 3423, Decomposition techniques of exponential operators and paraxial light optics, 0000 (14 July 1998); doi: 10.1117/12.316574
Non Linear Optics and Ultrashort Pulses
Proc. SPIE 3423, Ultrafast phenomena in an active microcavity, 0000 (14 July 1998); doi: 10.1117/12.316576
Proc. SPIE 3423, High-dynamic-range measurement of the temporal contrast of ultrashort UV pulses, 0000 (14 July 1998); doi: 10.1117/12.316577
Proc. SPIE 3423, Optical nonlinearities of fullerenes and their implications in optoelectronics, 0000 (14 July 1998); doi: 10.1117/12.316578
Proc. SPIE 3423, Stimulated Raman scattering in H2 and D2 using a pulsed Nd:YAG laser at 355 nm, 0000 (14 July 1998); doi: 10.1117/12.316579
Proc. SPIE 3423, Stimulated Raman scattering of long XeCl laser pulses in multimode silica fibers, 0000 (14 July 1998); doi: 10.1117/12.316580
Proc. SPIE 3423, Rotational and vibrational Raman scattering in H2, 0000 (14 July 1998); doi: 10.1117/12.316581
Proc. SPIE 3423, Molecular fragmentation induced by a femtosecond laser, 0000 (14 July 1998); doi: 10.1117/12.316582
Proc. SPIE 3423, New laser-based bistability system for optical computing applications, 0000 (14 July 1998); doi: 10.1117/12.316583
Laser Spectroscopy and Applications
Proc. SPIE 3423, Observation of conformers with laser electronic spectroscopy in supersonic molecular beams, 0000 (14 July 1998); doi: 10.1117/12.316584
Proc. SPIE 3423, High-sensitivity trace-gas monitoring for medical and environmental applications using a semiconductor diode laser, 0000 (14 July 1998); doi: 10.1117/12.316585
Proc. SPIE 3423, Spectral narrowing in the emission of rhodamine 6G incorporated in thin surfactant films, 0000 (14 July 1998); doi: 10.1117/12.316587
Proc. SPIE 3423, Laser-induced breakdown spectroscopy (LIBS): a tool for rapid in-situ elemental analysis, 0000 (14 July 1998); doi: 10.1117/12.316588
Proc. SPIE 3423, Ultratrace analysis of calcium with high isotopic selectivity by diode laser resonance ionization mass spectrometry, 0000 (14 July 1998); doi: 10.1117/12.316589
Proc. SPIE 3423, Gas-detection instrument based on external-cavity diode lasers and photoacoustic detectors, 0000 (14 July 1998); doi: 10.1117/12.316590
Proc. SPIE 3423, 4f3 - 4f25d interconfigurational transitions of Nd3+ ions in LiCaAlF6 single crystal, 0000 (14 July 1998); doi: 10.1117/12.316591
Proc. SPIE 3423, Spectroscopy of triatomic alkali rare-gas ionic excimers, 0000 (14 July 1998); doi: 10.1117/12.316592
Proc. SPIE 3423, Diffusing wave spectroscopy in dynamically heterogeneous random media, 0000 (14 July 1998); doi: 10.1117/12.316593
Environmental Sciences and Engineering
Proc. SPIE 3423, Laser-triggered lightning, 0000 (14 July 1998); doi: 10.1117/12.316594
Proc. SPIE 3423, Advanced-technology laser-aided air pollution monitoring in Athens: the Greek differential absorption lidar, 0000 (14 July 1998); doi: 10.1117/12.316595
Proc. SPIE 3423, Qualitative determination of organic pollutants in an aquatic environment by laser-induced fluorescence combined with optical fibers, 0000 (14 July 1998); doi: 10.1117/12.316596
Proc. SPIE 3423, Kinetics of gas-phase tropospheric reactions of organic solvents and hydroxyl radical by laser photolysis laser-induced fluorescence, 0000 (14 July 1998); doi: 10.1117/12.316598
Proc. SPIE 3423, Free atmospheric broadcasting of radio, TV and teletext with laser radiation, 0000 (14 July 1998); doi: 10.1117/12.316599
Proc. SPIE 3423, Recent developments in nonintrusive measuring techniques for particle velocity and size measurements, 0000 (14 July 1998); doi: 10.1117/12.316600
Proc. SPIE 3423, Study of vortical structures by means of particle image velocimetry, 0000 (14 July 1998); doi: 10.1117/12.316601
Laser-Matter Interaction and Industrial Applications
Proc. SPIE 3423, Lasers in the conservation of painted artworks, 0000 (14 July 1998); doi: 10.1117/12.316602
Proc. SPIE 3423, Diagnostics of the laser deposition process by optical methods, 0000 (14 July 1998); doi: 10.1117/12.316603
Proc. SPIE 3423, Pulsedlaser deposition and laser machining of diamondlike carbon films, 0000 (14 July 1998); doi: 10.1117/12.316604
Proc. SPIE 3423, Excimer laser treatment of nickel-coated mild steel, 0000 (14 July 1998); doi: 10.1117/12.316605
Proc. SPIE 3423, Laser-induced deposition and etching of tungsten microstructures, 0000 (14 July 1998); doi: 10.1117/12.316606
Proc. SPIE 3423, Pulsed laser deposition of oxide cuprate superlattices, 0000 (14 July 1998); doi: 10.1117/12.316607