CONFERENCE PROCEEDINGS
Advanced Search
Home > Proceedings > Volume 10991 > Article
Presentation + Paper
13 May 2019 Motion-induced error reduction for phase shifting profilometry using double-shot-in-single-illumination technique
Vignesh Suresh, Yajun Wang, Beiwen Li
Author Affiliations +
Proceedings Volume 10991, Dimensional Optical Metrology and Inspection for Practical Applications VIII; 1099108 (2019) https://doi.org/10.1117/12.2518319
Event: SPIE Defense + Commercial Sensing, 2019, Baltimore, MD, United States
Abstract
This research proposes a motion-induced error reduction method for phase shifting profilomtry. Particularly, each illuminated fringe pattern will be captured twice in one projection cycle when imaging a highly dynamic scene, resulting in two sets of phase shifted fringe images be obtained. A phase map will be computed for each phase shifting set in preparation for error analysis. Finally, motion-induced phase errors will be compensated by examining the difference of the two phase maps obtained respectively from two phase shifting sets. This method uses defocused 1-bit binary patterns to bypass rigid camera-projector synchronization, which has potential for high-speed applications.
Conference Presentation
© (2019) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Citation Download Citation
Vignesh Suresh, Yajun Wang, and Beiwen Li "Motion-induced error reduction for phase shifting profilometry using double-shot-in-single-illumination technique", Proc. SPIE 10991, Dimensional Optical Metrology and Inspection for Practical Applications VIII, 1099108 (13 May 2019); https://doi.org/10.1117/12.2518319
ACCESS THE FULL ARTICLE
ORGANIZATIONAL
Sign in with credentials provided by your organization.
INSTITUTIONAL
Select your institution to access the SPIE Digital Library.
SELECT YOUR INSTITUTION
PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.
PERSONAL SIGN IN
No SPIE Account? Create one
PURCHASE THIS CONTENT
SUBSCRIBE TO DIGITAL LIBRARY
50 downloads per 1-year subscription
Members: $195
Non-members: $335 ADD TO CART
25 downloads per 1 - year subscription
Members: $145
Non-members: $250 ADD TO CART
PURCHASE SINGLE ARTICLE
Includes PDF, HTML & Video, when available
Members: $17.00
Non-members: $21.00 ADD TO CART
PROCEEDINGS
 6 PAGES + PRESENTATION
DOWNLOAD PAPER SAVE TO MY LIBRARY
WATCH
PRESENTATION
GET CITATION
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Phase shifting
3D metrology
Fringe analysis
RELATED CONTENT
Subscribe to Digital Library
Receive Erratum Email Alert
Back to Top