Effect of mirror curvature on the angular resolution of silicon pore optics

Arne S. Jegers; Desiree Della Monica Ferreira; Erik Bergbäck Knudsen; Sonny Massahi; Sara Svendsen; Peter Lindquist Henriksen; Nis Christian Gellert; Giorgia Sironi; Daniele Spiga; Ivo Ferreira; Brian Shortt; Marcos Bavdaz

doi:10.1117/12.2594530

30 August 2021 Effect of mirror curvature on the angular resolution of silicon pore optics

Arne S. Jegers, Desiree Della Monica Ferreira, Erik Bergbäck Knudsen, Sonny Massahi, Sara Svendsen, Peter Lindquist Henriksen, Nis Christian Gellert, Giorgia Sironi, Daniele Spiga, Ivo Ferreira, Brian Shortt, Marcos Bavdaz

Author Affiliations +

Proceedings Volume 11822, Optics for EUV, X-Ray, and Gamma-Ray Astronomy X; 118220F (2021) https://doi.org/10.1117/12.2594530
Event: SPIE Optical Engineering + Applications, 2021, San Diego, California, United States

Abstract

Silicon Pore Optics are a novel technology for focusing high-energy photons, where pairs of mirror plates stacked into mirror modules. This paper presents a study of the angular resolution of SPO mirror assemblies, using a selection of sagittal mirror curvatures. Results were achieved by ray-tracing the different configurations of the mirror with the ray tracing software SPORT, or Silicon Pore Optics Ray Tracer, using an observation of the Crab Nebula originally obtained by Chandra. It is found that a true Wolter geometry most closely reproduces the original image, while geometries with a conic approximation on either their primary or secondary mirrors create the most diffuse image. A geometry with conic approximations on both primary and secondary mirrors falls in between the two extremes.

Citation Download Citation

Arne S. Jegers, Desiree Della Monica Ferreira, Erik Bergbäck Knudsen, Sonny Massahi, Sara Svendsen, Peter Lindquist Henriksen, Nis Christian Gellert, Giorgia Sironi, Daniele Spiga, Ivo Ferreira, Brian Shortt, and Marcos Bavdaz "Effect of mirror curvature on the angular resolution of silicon pore optics", Proc. SPIE 11822, Optics for EUV, X-Ray, and Gamma-Ray Astronomy X, 118220F (30 August 2021); https://doi.org/10.1117/12.2594530

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available