Infrared antenna metrology

José Manuel López-Alonso; Tasneem Mandviwala; Javier Alda; B. Lail; Glenn Boreman

doi:10.1117/12.631217

11 October 2005 Infrared antenna metrology

José Manuel López-Alonso, Tasneem Mandviwala, Javier Alda, B. Lail, Glenn Boreman

Proceedings Volume 5987, Electro-Optical and Infrared Systems: Technology and Applications II; 59870L (2005) https://doi.org/10.1117/12.631217
Event: European Symposium on Optics and Photonics for Defence and Security, 2005, Bruges, Belgium

Abstract

Infrared antennas are a novel type of detectors that couples electromagnetic radiation into metallic structures and feed it to a rectifying element. As their radio and millimeter counterparts, they can be characterized by parameters explaining their response in a variety of situations. The size of infrared antennas scales with the detected wavelength. Then, specifically designed experimental set-ups need to be prepared for their characterization. The measurement of the spatial responsivity map of infrared antennas is one of the parameters of interest, but other parameters can be defined to describe, for example, their directional response, or polarization response. One of the inputs to measure the spatial responsivity map is the spatial distribution of the beam irradiance illuminating the antenna-coupled detector. The measured quantity is actually a map of the response of the detector when it moves under the beam illumination. This measurement is given as the convolution of the actual responsivity map and the beam irradiance distrbution. The uncertainties, errors, and artifacts incorporated along the measurement procedure are analyzed by using the Principal Component Analysis (PCA). By means of this method is possible to classify different sources of uncertainty. PCA is applied as a metrology tool to characterize the accuracy and repeatability of the experimental set-up. Various examples are given to describe the application of the PCA to the characterization of the deconvolution procedure, and to define the responsivity and the signal-to-noise ratio of the measured results.

Citation Download Citation

José Manuel López-Alonso, Tasneem Mandviwala, Javier Alda, B. Lail, and Glenn Boreman "Infrared antenna metrology", Proc. SPIE 5987, Electro-Optical and Infrared Systems: Technology and Applications II, 59870L (11 October 2005); https://doi.org/10.1117/12.631217

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