optical engineering
VOL. 33 · NO. 12 | December 1994
CONTENTS
IN THIS ISSUE

Articles (38)
Articles (2)
Articles
Brian Thompson
Opt. Eng. 33(12), (1 December 1994) doi:10.1117/12.193286
TOPICS: Optical engineering, X-ray optics, Physics, Optics, Image processing, Roads, Printing, Error analysis, Heat flux, Gold
John Hegarty, Noel Mitchell, Conleth Hussey
Opt. Eng. 33(12), (1 December 1994) doi:10.1117/12.193287
TOPICS: Optoelectronics, Physics, Semiconductor lasers, Optical fibers, Active optics, Water, Photography, Crystals, Laser applications, Laser development
Sara McMurry, Denis Weaire, James Lunney, Stefan Hutzler
Opt. Eng. 33(12), (1 December 1994) doi:10.1117/12.186402
TOPICS: Light scattering, Scattering, Diffusion, Monte Carlo methods, Foam, Solids, Liquids, Physics, Particles, Absorption
Francis Mulligan, Rick Niciejewski
Opt. Eng. 33(12), (1 December 1994) doi:10.1117/12.187022
TOPICS: Interferometers, Atmospheric optics, Temperature metrology, Sensors, Observatories, FT-IR spectroscopy, Airglow, Data acquisition, Wave propagation, Ocean optics
Brian MacCraith, Gerard O'Keeffe, Aisling McEvoy, Colette McDonagh, John McGilp, Brendan O'Kelly, J. O'Mahony, Mark Cavanagh
Opt. Eng. 33(12), (1 December 1994) doi:10.1117/12.184360
TOPICS: Oxygen, Sensors, Modulation, Luminescence, Ruthenium, Phase shift keying, Sol-gels, Coating, Wave sensors, Blue light emitting diodes
Vincent Weldon, James O'Gorman, Paul Phelan, Tawee Tanbun-Ek
Opt. Eng. 33(12), (1 December 1994) doi:10.1117/12.186419
TOPICS: Absorption, Semiconductor lasers, Signal detection, Distributed feedback laser diodes, Spectroscopy, Carbon dioxide, Nitrogen, Signal to noise ratio, Target detection, Atmospheric sensing
Norman McMillan, Eon O'Mongain, James Walsh, Liam Breen, Duncan McMillan, Michael Power, John O'Dea, Seamus Kinsella, Mairead Kelly, Conor Hammil, Dermot Orr
Opt. Eng. 33(12), (1 December 1994) doi:10.1117/12.184442
TOPICS: Head, Liquids, Refractive index, Absorbance, Water, Reflection, Phase modulation, Optoelectronics, Sensors, Rhodamine B
Opt. Eng. 33(12), (1 December 1994) doi:10.1117/12.187023
TOPICS: Absorbance, Waveguides, Fiber optics sensors, Signal attenuation, Spectroscopy, Cladding, Refractive index, Data modeling, Polymers, Sensors
John McGilp, Mark Cavanagh, John Power, J. O'Mahony
Opt. Eng. 33(12), (1 December 1994) doi:10.1117/12.186373
TOPICS: Interfaces, Spectroscopy, Second-harmonic generation, Silicon, Semiconductors, Picosecond phenomena, Antimony, Polarization, Optical spectroscopy, Harmonic generation
Jonathan Hyland, Gerard Farrell
Opt. Eng. 33(12), (1 December 1994) doi:10.1117/12.186416
TOPICS: Semiconductor lasers, Temperature metrology, Reflectivity, Mode locking, Tunable lasers, Laser stabilization, Copper, Chlorine, Sensors, Telecommunications
Michael Connelly, Ronan O'Dowd
Opt. Eng. 33(12), (1 December 1994) doi:10.1117/12.186403
TOPICS: Optical amplifiers, Electrodes, Transparency, Fiber amplifiers, Semiconductor lasers, Clocks, Multiplexing, Signal processing, Transmittance, Time division multiplexing
David McDonald, Seamus O'Leary, Mark Davis, Ronan O'Dowd
Opt. Eng. 33(12), (1 December 1994) doi:10.1117/12.186378
TOPICS: Modulation, Semiconductor lasers, Amplitude modulation, Calibration, Photodetectors, Spectrum analysis, Interferometers, Sum-frequency generation, Laser stabilization, Heterodyning
Yi-Guang Zhao, John McInerney, Robert Morgan
Opt. Eng. 33(12), (1 December 1994) doi:10.1117/12.186409
TOPICS: Vertical cavity surface emitting lasers, Pulsed laser operation, Near field, Refractive index, Hole burning spectroscopy, Gallium arsenide, Thermal effects, Physics, Semiconductor lasers, Quantum wells
John Doran, Fred Logue, T. Miyajima, Ross Stanley, John Donegan, John Hegarty
Opt. Eng. 33(12), (1 December 1994) doi:10.1117/12.186842
TOPICS: Excitons, Quantum wells, Absorption, Semiconductors, Epitaxial lateral overgrowth, Semiconductor materials, Scattering, Phonons, Temperature metrology, Deconvolution
Alan Morrison, John Lambkin, Eoin O'Sullivan, Stephen Fahy
Opt. Eng. 33(12), (1 December 1994) doi:10.1117/12.186385
TOPICS: Raman spectroscopy, Raman scattering, Diamond, Interfaces, Crystals, Semiconductor lasers, Semiconductors, Phonons, Laser scattering, Carbon
Gerard O'Connor, Conor McDonagh, Thomas Glynn, Gerard Morgan
Opt. Eng. 33(12), (1 December 1994) doi:
Mark Davis, Ronan O'Dowd
Opt. Eng. 33(12), (1 December 1994) doi:10.1117/12.186369
TOPICS: Modulation, Mirrors, Interferometers, Reflectivity, Optical filters, Temporal resolution, Semiconductor lasers, Photodetectors, Deconvolution, Fabry–Perot interferometers
Suzanne Martin, Philippe Leclere, Yvon Renotte, Vincent Toal, Yves Lion
Opt. Eng. 33(12), (1 December 1994) doi:10.1117/12.186423
TOPICS: Diffraction, Holography, Holographic materials, Modulation, Refractive index, Polymers, Diffraction gratings, Coating, Absorbance, Photorefractive polymers
Brian Dooley, Vincent Toal
Opt. Eng. 33(12), (1 December 1994) doi:10.1117/12.184375
TOPICS: Transducers, Speckle, Signal detection, Computer programming, Beam splitters, Logic, Interferometers, Phase shifts, Speckle interferometry, Sensors
Opt. Eng. 33(12), (1 December 1994) doi:10.1117/12.186841
TOPICS: Laser welding, Lead, Inspection, Cameras, Nd:YAG lasers, Light emitting diodes, Laser bonding, CCD cameras, Mirrors, Lasers
Paul Dodd, James Lunney, John Armstrong
Opt. Eng. 33(12), (1 December 1994) doi:10.1117/12.184439
TOPICS: Copper, Reflectivity, Metals, Multilayers, Reflectometry, Dielectrics, Thin films, Silicon, Cobalt, Magnetism
Shane White, Martin Henry, Enda McGlynn, John Lambkin, L. Considine
Opt. Eng. 33(12), (1 December 1994) doi:10.1117/12.187021
TOPICS: Semiconducting wafers, Luminescence, Helium, Superlattices, Liquids, Spectroscopy, Mirrors, Charge-coupled devices, Sensors, Semiconductors
Gerard O'Sullivan, Ronan Faulkner
Opt. Eng. 33(12), (1 December 1994) doi:10.1117/12.186840
TOPICS: Tin, Plasmas, Ions, Extreme ultraviolet, Nd:YAG lasers, Cesium, Tellurium, Absorption, Oxides, Barium
Eugene Kennedy, John Costello, Jean-Paul Mosnier, Attilio Cafolla, Martin Collins, Laurence Kiernan, Ulrich Koeble, Muhammad Sayyad, Matthew Shaw, Bernd Sonntag, Robert Barchewitz
Opt. Eng. 33(12), (1 December 1994) doi:10.1117/12.186393
TOPICS: Plasmas, Lithium, Extreme ultraviolet, Photons, Ions, Chemical species, Spectroscopy, Helium, Mirrors, Dye lasers
Gerard O'Sullivan, P. Carroll, James Conway, Padraig Dunne, Ronan Faulkner, Thomas McCormack, Cormac McGuinness, Paul van Kampen, Bernadette Weinmann
Opt. Eng. 33(12), (1 December 1994) doi:10.1117/12.184381
TOPICS: Plasmas, Extreme ultraviolet, Ions, Nd:YAG lasers, Laser applications, Chemical species, Pulsed laser operation, Strontium, Vacuum ultraviolet, Absorption
Youwei Li, Conleth Hussey
Opt. Eng. 33(12), (1 December 1994) doi:10.1117/12.184374
TOPICS: Optical fibers, Cladding, Dispersion, Single mode fibers, Refractive index, Silicon, Waveguides, Lithium, Signal attenuation, Step index fibers
Kenneth Oakley, Norma O'Sullivan, Robert Kenny, Conleth Hussey
Opt. Eng. 33(12), (1 December 1994) doi:10.1117/12.184440
TOPICS: Optical fibers, Wavelength division multiplexing, Waveguides, Control systems, Polarization, Composites, Cladding, Refractive index, Polishing, Waveguide modes
Jacques Ludman, H. John Caulfield, Val Morozov, John Sampson
Opt. Eng. 33(12), (1 December 1994) doi:10.1117/12.183396
TOPICS: Wavefronts, Adaptive optics, Spatial light modulators, Wavefront reconstruction, Optically addressed spatial light modulators, Mirrors, Atmospheric optics, Interferometers, Control systems, Roads
Michael Salisbury, Paul McManamon, Bradley Duncan
Opt. Eng. 33(12), (1 December 1994) doi:10.1117/12.183406
TOPICS: Signal to noise ratio, Fiber amplifiers, Heterodyning, LIDAR, Signal detection, Optical amplifiers, Sensors, Interference (communication), Spectrum analysis, Analog electronics
Hon-Fai Yau, Hsiao-Yi Lee, Peir-Jyh Wang
Opt. Eng. 33(12), (1 December 1994) doi:10.1117/12.183392
TOPICS: Crystals, Laser crystals, Ferroelectric materials, Helium neon lasers, Argon ion lasers, Polarization, Laser beam propagation, Wave plates, Channel projecting optics, Fluctuations and noise
Opt. Eng. 33(12), (1 December 1994) doi:10.1117/12.183411
TOPICS: Polymer optical fibers, Phase only filters, Image filtering, Spatial light modulators, Optical filters, Optical correlators, Energy efficiency, Picosecond phenomena, Computer simulations, Distortion
Opt. Eng. 33(12), (1 December 1994) doi:10.1117/12.183407
TOPICS: Calculus, Critical dimension metrology, Optical pattern recognition, Cadmium, Optical correlators, Pattern recognition, Integral transforms, Fourier transforms, Target recognition, Computer simulations
Opt. Eng. 33(12), (1 December 1994) doi:10.1117/12.183398
TOPICS: Holograms, Multiplexing, Optical correlators, Sensors, Correlation function, Signal detection, Spatial light modulators, Holography, Detector arrays, Image filtering
John Asvestas, David Englund
Opt. Eng. 33(12), (1 December 1994) doi:10.1117/12.183402
TOPICS: Solids, Tolerancing, Optical spheres, Optical engineering, Shape analysis, Radon, Spherical lenses, Error analysis, Image segmentation
Opt. Eng. 33(12), (1 December 1994) doi:10.1117/12.183395
TOPICS: Lens design, Optimization (mathematics), Ray tracing, Solids, Chromatic aberrations, Image quality, Control systems, Distortion, Patents, Optical design
Robert Jones
Opt. Eng. 33(12), (1 December 1994) doi:10.1117/12.183399
TOPICS: Polishing, Surface finishing, Mirrors, Manufacturing, Aspheric optics, Optics manufacturing, Metrology, Lamps, Diamond, Optical fabrication
Opt. Eng. 33(12), (1 December 1994) doi:10.1117/12.183394
TOPICS: Modulators, Optical fibers, Phase modulation, Phase shift keying, Modulation, Nonlinear optics, Optical switching, Differential equations, Electronics, Data communications
Xiaoyu Zhang, Richard Mammone
Opt. Eng. 33(12), (1 December 1994) doi:10.1117/12.183400
TOPICS: Phase modulation, Cameras, Projection systems, Phase shift keying, Image analysis, Signal analyzers, Error analysis, Modulation, Transform theory, Imaging systems
Jay Jordan, Wendell Watkins, Fernando Palacios, Daniel Billingsley
Opt. Eng. 33(12), (1 December 1994) doi:10.1117/12.183409
TOPICS: Imaging systems, Modulation transfer functions, Error analysis, Black bodies, Signal to noise ratio, Infrared imaging, Signal processing, Digital signal processing, Video, Spatial frequencies
Back to Top