Mrs. Antje Kaless
Product Assurance at RUAG Space AG
SPIE Involvement:
Author
Publications (4)

PROCEEDINGS ARTICLE | October 20, 2005
Proc. SPIE. 5965, Optical Fabrication, Testing, and Metrology II
KEYWORDS: Refractive index, Polymethylmethacrylate, Reflection, Etching, Metals, Coating, Stochastic processes, Plasma treatment, Plasma, Absorption

PROCEEDINGS ARTICLE | October 20, 2005
Proc. SPIE. 5965, Optical Fabrication, Testing, and Metrology II
KEYWORDS: Nanostructures, Antireflective coatings, Polymethylmethacrylate, Etching, Polymers, Ions, Scanning electron microscopy, Absorbance, Plasma treatment, Plasma

PROCEEDINGS ARTICLE | August 24, 2005
Proc. SPIE. 5872, Advancements in Polymer Optics Design, Fabrication, and Materials
KEYWORDS: Refractive index, Antireflective coatings, Polymethylmethacrylate, Reflection, Etching, Polymers, Ions, Optical coatings, Reflectivity, Plasma

PROCEEDINGS ARTICLE | February 25, 2004
Proc. SPIE. 5250, Advances in Optical Thin Films
KEYWORDS: Thin films, Nanostructures, Scattering, Water, Light scattering, Coating, Atomic force microscopy, Solids, Optical interferometry, Scanning tunneling microscopy

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