Dr. Bozenko F. Oreb Profile

Dr. Bozenko F. Oreb

Senior Research Scientist at CSIRO

SPIE Involvement:

Conference Program Committee | Author

Publications (32)

SPIE Journal Paper | February 1, 2011

Chemical bonding for precision optical assemblies

Green, Katie , Burke, Jan , Oreb, Bozenko

OE Vol. 50 Issue 02

KEYWORDS: Zerodur, Silicates, Glasses, Optical fabrication, Bioalcohols, Interfaces, Silica, Ozone, Optical engineering, Distortion

Read Abstract

PROCEEDINGS ARTICLE | August 11, 2008

Fabrication and testing of a high-precision concave spherical mirror

Proc. SPIE. 7064, Interferometry XIV: Applications

KEYWORDS: Photovoltaics, Mirrors, Polishing, Optical spheres, Interferometers, Calibration, Error analysis, Wavefronts, Spherical lenses, Phase shifts

Read Abstract

PROCEEDINGS ARTICLE | July 28, 2008

Certification of the full size double corner cube fiducials for the Space Interferometer Mission-PlanetQuest test bed

Proc. SPIE. 7013, Optical and Infrared Interferometry

KEYWORDS: Microscopes, Photovoltaics, Metrology, Retroreflectors, Interferometers, Glasses, Reflectivity, Platinum, Optical fabrication, Radium

Read Abstract

PROCEEDINGS ARTICLE | August 14, 2006

Development of precision double corner cubes for the Space Interferometer Mission

Proc. SPIE. 6292, Interferometry XIII: Techniques and Analysis

KEYWORDS: Gold, Microscopes, Prisms, Fabry–Perot interferometers, Polishing, Metrology, Interferometers, Coating, Wavefronts, Zerodur

Read Abstract

PROCEEDINGS ARTICLE | December 9, 2005

Measurement of optical thickness variation of a multiple-surface object by a wavelength tuning interferometer

Proc. SPIE. 6024, ICO20: Optical Devices and Instruments

KEYWORDS: Wafer-level optics, Lithium niobate, Silica, Reflection, Interferometers, Glasses, Interferometry, Optical testing, Wavelength tuning, Semiconducting wafers

Read Abstract

PROCEEDINGS ARTICLE | October 20, 2005

Manufacturing and testing of precision optical components - from substrate to coating and assembling

Proc. SPIE. 5965, Optical Fabrication, Testing, and Metrology II

KEYWORDS: Optical components, Mirrors, Prisms, Polishing, Metrology, Interferometers, Particles, Coating, Distortion, Surface finishing

Read Abstract

PROCEEDINGS ARTICLE | August 19, 2005

Precision metrology of dihedral angle error in prisms and corner cubes for the Space Interferometry Mission

Proc. SPIE. 5869, Optical Manufacturing and Testing VI

KEYWORDS: Mirrors, Prisms, Fringe analysis, Retroreflectors, Interferometers, Error analysis, Interferometry, Wavefronts, Collimation, Phase shifts

Read Abstract

PROCEEDINGS ARTICLE | August 2, 2004

Interferometric measurement of a multiparallel-surface transparent object by a new class of wavelength tuning algorithms

Proc. SPIE. 5531, Interferometry XII: Techniques and Analysis

KEYWORDS: Refractive index, Detection and tracking algorithms, Modulation, Glasses, Interferometry, Interference (communication), Phase measurement, Algorithm development, Signal detection, Phase shifts

Read Abstract

PROCEEDINGS ARTICLE | December 22, 2003

Measurement of surface figure and optical thickness variation of a thin parallel plate in wavelength-scanned interferometry with minimized laser tuning range

Proc. SPIE. 5180, Optical Manufacturing and Testing V

KEYWORDS: Photovoltaics, Refractive index, Detection and tracking algorithms, Interferometers, Interferometry, Wavelength tuning, Algorithm development, Signal detection, Phase shifts, Fizeau interferometers

Read Abstract

PROCEEDINGS ARTICLE | November 19, 2003

Refractive index inhomogeneity measurement of a parallel plate in a Fizeau interferometer by a new wavelength scanning algorithm

Proc. SPIE. 4829, 19th Congress of the International Commission for Optics: Optics for the Quality of Life

KEYWORDS: Refractive index, Interferometers, Glasses, Interferometry, Optical testing, Sapphire, Absorbance, Phase measurement, Surface finishing, Fizeau interferometers

Read Abstract

PROCEEDINGS ARTICLE | June 20, 2002

Improved algorithms for wavelength scanning interferometry: application to the simultaneous measurement of surface topography and optical thickness variation in a transparent parallel plate

Proc. SPIE. 4777, Interferometry XI: Techniques and Analysis

KEYWORDS: Refractive index, Detection and tracking algorithms, Modulation, Reflection, Interferometers, Dispersion, Interferometry, Optical testing, Signal detection, Fizeau interferometers

Read Abstract

SPIE Journal Paper | February 1, 2002

Stitching interferometric measurement data for inspection of large optical components

Sjoedahl, Mikael , Oreb, Bozenko

OE Vol. 41 Issue 02

KEYWORDS: Signal to noise ratio, Interferometers, Interferometry, Matrices, Inspection, Optical components, Optical inspection, Optical engineering, Digital filtering, Image processing

PROCEEDINGS ARTICLE | December 27, 2001

Interferometric measurement of refractive index inhomogeneity on polished sapphire substrates: application to LIGO-II

Proc. SPIE. 4451, Optical Manufacturing and Testing IV

KEYWORDS: LIGO, Refractive index, Polishing, Polarization, Interferometers, Crystals, Wavefronts, Distortion, Sapphire, Surface finishing

Read Abstract

PROCEEDINGS ARTICLE | November 11, 1999

Characterization of wavefront variations in coated optics

Proc. SPIE. 3782, Optical Manufacturing and Testing III

KEYWORDS: LIGO, Monochromatic aberrations, Antireflective coatings, Reflection, Interferometers, Optical coatings, Reflectivity, Wavefronts, Distortion, Nanoimprint lithography

Read Abstract

PROCEEDINGS ARTICLE | November 11, 1999

Manufacture of LIGO core optics at CSIRO

Proc. SPIE. 3782, Optical Manufacturing and Testing III

KEYWORDS: LIGO, Monochromatic aberrations, Beam splitters, Polishing, Interferometers, Silicon, Wavefronts, Tolerancing, Optics manufacturing, Surface finishing

Read Abstract

PROCEEDINGS ARTICLE | November 11, 1999

LIGO optics manufacture: figuring transmission core optics for best performance

Proc. SPIE. 3782, Optical Manufacturing and Testing III

KEYWORDS: LIGO, Refractive index, Beam splitters, Polishing, Interferometers, Silicon, Wavefronts, Optics manufacturing, Zerodur, Surface finishing

Read Abstract

PROCEEDINGS ARTICLE | September 7, 1999

Coating requirements for the reference flat of a Fizeau interferometer used for measuring from uncoated to highly reflecting surfaces

Proc. SPIE. 3738, Advances in Optical Interference Coatings

KEYWORDS: LIGO, Fringe analysis, Silica, Reflection, Interfaces, Coating, Reflectivity, Critical dimension metrology, Surface finishing, Fizeau interferometers

Read Abstract

PROCEEDINGS ARTICLE | August 17, 1999

Fabrication and metrology of km-scale radii on surfaces of master tooling

Proc. SPIE. 3745, Interferometry '99: Applications

Read Abstract

PROCEEDINGS ARTICLE | August 17, 1999

Metrology of transmission optics for LIGO

Proc. SPIE. 3745, Interferometry '99: Applications

Read Abstract

PROCEEDINGS ARTICLE | August 13, 1999

Combined deformation and shape measurement with ESPI

Proc. SPIE. 3744, Interferometry '99: Techniques and Technologies

Read Abstract

PROCEEDINGS ARTICLE | August 13, 1999

Metrology of LIGO core optics

Proc. SPIE. 3744, Interferometry '99: Techniques and Technologies

Read Abstract

SPIE Journal Paper | August 1, 1999

300-mm-aperture phase-shifting Fizeau interferometer

Fairman, Philip , Ward, B. , Oreb, Bozenko , Farrant, David , Gilliand, Yves , Freund, Christopher , Leistner, Achim , Seckold, Jeffrey , Walsh, Christopher

OE Vol. 38 Issue 08

KEYWORDS: Phase shifts, Nanoimprint lithography, Optical testing, Monochromatic aberrations, Wavefronts, Fizeau interferometers, Semiconductor lasers, Sensors, Beam splitters, Foam

PROCEEDINGS ARTICLE | July 19, 1999

Precision optics for long baseline interferometry

Proc. SPIE. 3749, 18th Congress of the International Commission for Optics

KEYWORDS: LIGO, Beam splitters, Polishing, Interferometers, Interferometry, Wavefronts, Tolerancing, Optics manufacturing, Precision optics, Surface finishing

Read Abstract

PROCEEDINGS ARTICLE | December 12, 1997

Transient deformation measurement using dual-pulse addition ESPI

Proc. SPIE. 3173, Ultrahigh- and High-Speed Photography and Image-based Motion Measurement

KEYWORDS: Mirrors, Imaging systems, Cameras, Laser development, Nd:YAG lasers, Fourier transforms, Interferometry, Quantitative analysis, Speckle pattern, Bandpass filters

Read Abstract

PROCEEDINGS ARTICLE | November 1, 1997

Metrology of LIGO Pathfinder optics

Proc. SPIE. 3134, Optical Manufacturing and Testing II

KEYWORDS: LIGO, Monochromatic aberrations, Metrology, Spatial frequencies, Interferometers, Calibration, Manufacturing, Optical testing, Phase measurement, Surface finishing

Read Abstract

PROCEEDINGS ARTICLE | March 20, 1997

Current experimental techniques for high-temperature displacement/strain evaluation: an outline of available techniques

Proc. SPIE. 2921, International Conference on Experimental Mechanics: Advances and Applications

KEYWORDS: Optical fibers, Moire patterns, Speckle, Manufacturing, Resistance, Numerical analysis, Speckle pattern, Capacitance, LCDs, Temperature metrology

Read Abstract

PROCEEDINGS ARTICLE | June 14, 1995

Simultaneous measurements of vector components of displacement by ESPI and FFT techniques

Proc. SPIE. 2544, Interferometry VII: Techniques and Analysis

KEYWORDS: Modulation, Speckle, Cameras, Image processing, Light scattering, Fourier transforms, Interferometry, Electronic components, Speckle pattern, Image filtering

Read Abstract

PROCEEDINGS ARTICLE | July 23, 1993

Contouring the shape of contact lenses by projected fringe profilometry

Proc. SPIE. 1983, 16th Congress of the International Commission for Optics: Optics as a Key to High Technology

Read Abstract

PROCEEDINGS ARTICLE | February 5, 1993

Propagation of errors in different phase-shifting algorithms: a special property of the arctangent function

Proc. SPIE. 1755, Interferometry: Techniques and Analysis

KEYWORDS: Phase shifting, Detection and tracking algorithms, Modulation, Sensors, Error analysis, Interferometry, Aluminum, Phase measurement, Signal detection, Phase shifts

Read Abstract

PROCEEDINGS ARTICLE | February 5, 1993

New seven-sample symmetrical phase-shifting algorithm

Proc. SPIE. 1755, Interferometry: Techniques and Analysis

KEYWORDS: Phase shifting, Detection and tracking algorithms, Error analysis, Ions, Fourier transforms, Interferometry, Algorithm development, Fourier theory, Phase shifts, Algorithms

Read Abstract