Mr. François Maurice Torner
at Technische Univ Kaiserslautern
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | July 14, 2017
Proc. SPIE. 10329, Optical Measurement Systems for Industrial Inspection X
KEYWORDS: Oxides, Ellipsometry, Refractive index, Multilayers, Polarization, Optical properties, Graphics processing units, Silicon, Optical coatings, Phase shift keying, Aluminum, Electromagnetism, Statistical modeling, Oxidation

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