Ian Aeby
Application Engineer at EMCORE Corp
SPIE Involvement:
Publications (5)

Proceedings Article | 10 October 2012 Paper
Michael Winter, Ian Aeby, James Foresi
Proceedings Volume 8468, 846805 (2012) https://doi.org/10.1117/12.928880
KEYWORDS: Receivers, Reliability, Humidity, Silicon, Concentrated solar cells, Optical inspection, Sun, Temperature metrology, Solar cells, Visualization

Proceedings Article | 14 March 2005 Paper
Ian Aeby, Lei Yang, Olga Lavrova, Hai Ling, Doug Collins, Charlie Wang, Chiyu Liu, Thomas Whittington
Proceedings Volume 5737, (2005) https://doi.org/10.1117/12.601936
KEYWORDS: Vertical cavity surface emitting lasers, Data communications, Temperature metrology, Fiber optics, Near field optics, Fiber optic communications, Transceivers, Eye, Optical fibers, Reliability

Proceedings Article | 16 June 2004 Paper
Christopher Helms, Ian Aeby, Wenlin Luo, Robert Herrick, Albert Yuen
Proceedings Volume 5364, (2004) https://doi.org/10.1117/12.539282
KEYWORDS: Vertical cavity surface emitting lasers, Oxides, Reliability, Failure analysis, Manufacturing, Transceivers, Mirrors, Electroluminescence, Transmission electron microscopy, Semiconducting wafers

Proceedings Article | 17 June 2003 Paper
Ian Aeby, Doug Collins, Brian Gibson, Christopher Helms, Hong Hou, Wenlin Lou, David Bossert, Charlie Wang
Proceedings Volume 4994, (2003) https://doi.org/10.1117/12.482633
KEYWORDS: Vertical cavity surface emitting lasers, Failure analysis, Semiconducting wafers, Reliability, Oxides, Data communications, Optical inspection, Bismuth, Data modeling, Accelerated life testing

Proceedings Article | 4 June 2002 Paper
David Bossert, Doug Collins, Ian Aeby, J. Bridget Clevenger, Christopher Helms, Wenlin Luo, Charlie Wang, Hong Hou
Proceedings Volume 4649, (2002) https://doi.org/10.1117/12.469228
KEYWORDS: Vertical cavity surface emitting lasers, Oxides, Picosecond phenomena, Resistance, Modulation, Data communications, Capacitance, Eye, Reliability, Temperature metrology

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