John T. Caulfield
Chief Scientist at
SPIE Involvement:
Senior status | Conference Program Committee | Author
Publications (28)

PROCEEDINGS ARTICLE | May 16, 2017
Proc. SPIE. 10177, Infrared Technology and Applications XLIII
KEYWORDS: Staring arrays, Readout integrated circuits, Infrared detectors, Defense and security, Infrared sensors, Mid-IR, Mercury cadmium telluride, Cameras, Sensors, Sensor performance, Detector development, Prototyping

PROCEEDINGS ARTICLE | May 16, 2017
Proc. SPIE. 10177, Infrared Technology and Applications XLIII
KEYWORDS: Staring arrays, Readout integrated circuits, Infrared sensors, Mid-IR, Mercury cadmium telluride, Sensors, Gallium arsenide, Quantum efficiency, Sensor performance, Superlattices

PROCEEDINGS ARTICLE | May 3, 2017
Proc. SPIE. 10177, Infrared Technology and Applications XLIII
KEYWORDS: Staring arrays, Readout integrated circuits, Signal to noise ratio, Infrared sensors, Infrared imaging, Mid-IR, Imaging systems, Sensors, Image resolution, Monte Carlo methods, Modulation transfer functions, Signal detection, Sensor technology, Yield improvement

PROCEEDINGS ARTICLE | September 17, 2015
Proc. SPIE. 9555, Optical Sensing, Imaging, and Photon Counting: Nanostructured Devices and Applications
KEYWORDS: Staring arrays, Readout integrated circuits, Signal to noise ratio, Infrared imaging, Mid-IR, Point spread functions, Imaging systems, Sensors, Image resolution, Signal detection

PROCEEDINGS ARTICLE | June 4, 2015
Proc. SPIE. 9451, Infrared Technology and Applications XLI
KEYWORDS: Staring arrays, Readout integrated circuits, Signal to noise ratio, Mid-IR, Diffraction, Point spread functions, Imaging systems, Sensors, Image resolution, Signal detection

PROCEEDINGS ARTICLE | June 24, 2014
Proc. SPIE. 9070, Infrared Technology and Applications XL
KEYWORDS: Staring arrays, Readout integrated circuits, Infrared imaging, Short wave infrared radiation, Imaging systems, Sensors, Image processing, Biomimetics, Infrared radiation, Infrared technology

Showing 5 of 28 publications
Conference Committee Involvement (16)
Infrared Technology and Applications XLV
14 April 2019 | Baltimore, Maryland, United States
Infrared Technology and Applications XLIV
16 April 2018 | Orlando, Florida, United States
Infrared Technology and Applications XLIII
9 April 2017 | Anaheim, California, United States
Infrared Technology and Applications XLII
18 April 2016 | Baltimore, Maryland, United States
Infrared Technology and Applications XLI
20 April 2015 | Baltimore, Maryland, United States
Showing 5 of 16 published special sections
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