Dr. Juan J. Faria-Briceno
Post Doctoral Fellow at Univ of New Mexico
SPIE Involvement:
Area of Expertise:
In/Off line Metrology , Optical Scatterometry , Nano Manufacturing , Roll-to-roll fabrication , Nano fluidics
Profile Summary

Dr. Faria-Briceno received his B.S. degree in Electrical and Computer Engineering with University Honors (Cum Laude) in 2015. Dr. Faria-Briceno is a Ronald E. McNair/ROP fellow having participated in the program in 2013-2014. Dr. Faria-Briceno earned two Master of Science degrees: Optoelectronics with the Electrical and Computer Engineering Department and Photonics Optical Science and Engineering). Dr. Faria-Briceno earned a PhD in Optoelectronics (Electrical and Computer Engineering) with Dissertation Honors in which he was fully funded by a National Science Foundation - Engineering Research Center (NSF-ERC NASCENT) developing technologies for Nanomanufacturing process. Dr. Faria-Briceno’s research focuses on designing new alternative metrology systems for R2R manufacturing process (dissertation titled “Optical Angular Scatterometry for In-line R2R Manufacturing). His work has been published in the refereed Journals: JVST-B, AIP, and Nature-Scientific Reports and presented at national/international conferences.
Publications (1)

Proceedings Article | 22 February 2021 Presentation + Paper
Juan Faria-Briceno, Vineeth Sasidharan, Alexander Neumann, Shrawan Singhal, S. V. Sreenivasan, S. R. Brueck
Proceedings Volume 11610, 116100F (2021) https://doi.org/10.1117/12.2593730

  • View contact details

Is this your profile? Update it now.
Don’t have a profile and want one?

Back to Top