Dr. Jungjae Park
at Korea Research Institute of Standards and Science
SPIE Involvement:
Author
Publications (6)

PROCEEDINGS ARTICLE | May 28, 2014
Proc. SPIE. 9110, Dimensional Optical Metrology and Inspection for Practical Applications III
KEYWORDS: Packaging, Wafer-level optics, Semiconductors, Light sources, Metrology, Interferometers, Spectroscopy, Silicon, Geometrical optics, Semiconducting wafers

PROCEEDINGS ARTICLE | June 5, 2013
Proc. SPIE. 8706, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXIV
KEYWORDS: Wafer-level optics, Refractive index, Light sources, Femtosecond phenomena, Silicon, Reliability, Semiconductor lasers, Phase measurement, Semiconducting wafers, Pulsed laser operation

PROCEEDINGS ARTICLE | June 5, 2013
Proc. SPIE. 8706, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXIV
KEYWORDS: Wafer-level optics, Refractive index, Light sources, Femtosecond phenomena, Spectroscopy, Silicon, Fourier transforms, Geometrical optics, Semiconducting wafers, Pulsed laser operation

PROCEEDINGS ARTICLE | September 10, 2009
Proc. SPIE. 7432, Optical Inspection and Metrology for Non-Optics Industries
KEYWORDS: Mirrors, Phase shifting, Ferroelectric materials, Detection and tracking algorithms, Interferometers, Error analysis, Wavefronts, Single mode fibers, Phase measurement, Spherical lenses

PROCEEDINGS ARTICLE | August 14, 2006
Proc. SPIE. 6293, Interferometry XIII: Applications
KEYWORDS: Optical fibers, Beam splitters, Waveguides, Polarization, Interferometers, Wavefronts, Wave plates, Spherical lenses, Semiconducting wafers, Phase shifts

PROCEEDINGS ARTICLE | June 13, 2005
Proc. SPIE. 5856, Optical Measurement Systems for Industrial Inspection IV
KEYWORDS: Mirrors, Beam splitters, Waveguides, Polarization, Interferometers, Glasses, Wavefronts, Wave plates, Spherical lenses, Phase shifts

Showing 5 of 6 publications
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