Prof. Liam Blunt
at Univ. of Huddersfield
SPIE Involvement:
Publications (5)

Proceedings Article | 25 April 2023 Presentation + Paper
Proceedings Volume 12490, 1249007 (2023)
KEYWORDS: Printing, Metrology, Manufacturing, Phase shifts, Optical surfaces, Interferometers, Interferograms, Flexible circuits, Thin films, Interferometry

Proceedings Article | 5 August 2015 Paper
F. Gao, H. Muhamedsalih, D. Tang, M. Elrawemi, L. Blunt, X. Jiang, S. Edge, D. Bird, P. Hollis
Proceedings Volume 9622, 96220E (2015)
KEYWORDS: Inspection, Photovoltaics, Defect detection, Environmental sensing, Interferometry, Interferometers, Objectives, Manufacturing, Metrology, CCD cameras

Proceedings Article | 31 January 2013 Paper
Proceedings Volume 8759, 87590Q (2013)
KEYWORDS: Surface finishing, Diamond, Abrasives, Photomicroscopy, Software development, Precision measurement, Microscopes, Manufacturing, Optical microscopes, Optical microscopy

Proceedings Article | 31 December 2008 Paper
Yan Zhao, Zhen He, Liam Blunt, Xiangqian Jiang, Yanlong Cao, Hongyu Zhang
Proceedings Volume 7130, 71305X (2008)
KEYWORDS: Binary data, Analytical research, Manufacturing, Mechanical engineering, Reliability, Data acquisition, Environmental sensing, Computing systems, Optical inspection, Statistical modeling

Proceedings Article | 16 September 2002 Paper
Xiangqian Jiang, Shaojun Xiao, Liam Blunt
Proceedings Volume 4929, (2002)
KEYWORDS: Wavelets, Radon transform, Feature extraction, Wavelet transforms, Head, Continuous wavelet transforms, Discrete wavelet transforms, Radon, Optical pattern recognition, Image processing

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