Marek Stehlik
at Institut Fresnel UMR7249 CNRS
SPIE Involvement:
Author
Publications (6)

Proceedings Article | 2 December 2022 Poster + Presentation + Paper
Proceedings Volume 12300, 123000A (2022) https://doi.org/10.1117/12.2642516
KEYWORDS: Contamination, Niobium, Dielectrics, Optical coatings, Thin films, Optical components, Laser applications, Deposition processes, Optical testing, Silica, Hafnium

Proceedings Article | 2 December 2022 Presentation + Paper
Proceedings Volume 12300, 123000G (2022) https://doi.org/10.1117/12.2641792
KEYWORDS: Lutetium, Sapphire, Aluminum, Refractive index, Laser induced damage, Niobium, Laser damage threshold, Oxides, Scandium, Yttrium

SPIE Journal Paper | 18 May 2022 Open Access
OE, Vol. 61, Issue 07, 079801, (May 2022) https://doi.org/10.1117/12.10.1117/1.OE.61.7.079801
KEYWORDS: Thin films, Thin film deposition, Laser induced damage, Laser damage threshold, Optical engineering, Optoelectronics

SPIE Journal Paper | 23 April 2022 Open Access
OE, Vol. 61, Issue 07, 071603, (April 2022) https://doi.org/10.1117/12.10.1117/1.OE.61.7.071603
KEYWORDS: Lutetium, Laser induced damage, Hybrid fiber optics, Aluminum, Laser damage threshold, Sapphire, Refractive index, YAG lasers, Thin films, Niobium

Proceedings Article | 12 October 2021 Poster + Presentation
Fabien Lemarchand, Marek Stehlik, Frank Wagner, Janis Zideluns, Julien Lumeau, Laurent Gallais
Proceedings Volume 11910, 119101Q (2021) https://doi.org/10.1117/12.2598856
KEYWORDS: Dielectrics, Contamination, Laser marking, Laser drilling, Ionization, Semiconductor lasers, Reliability, Oxides, Optical filters, Optical design

Showing 5 of 6 publications
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