Prof. Maria Cristina Piccirilli
at Univ di Firenze
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 30 June 2005 Paper
Proceedings Volume 5837, (2005) https://doi.org/10.1117/12.607521
KEYWORDS: Monte Carlo methods, Computer aided design, Device simulation, Analog electronics, Tolerancing, Computer simulations, Statistical analysis, Manufacturing, Argon, Chromium

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