Dr. Martin U. Pralle
VP of Business Development at SiOnyx Inc
SPIE Involvement:
Publications (18)

Proceedings Article | 28 April 2021 Presentation + Paper
M. Pralle, C. Vineis, C. Palsule, J. Jiang, J. Carey
Proceedings Volume 11741, 117410E (2021) https://doi.org/10.1117/12.2588472

Proceedings Article | 20 May 2016 Paper
M. Pralle, C. Vineis, C. Palsule, J. Jiang, J. Carey
Proceedings Volume 9819, 981904 (2016) https://doi.org/10.1117/12.2223063
KEYWORDS: Quantum efficiency, Silicon, Near infrared, Sensors, CMOS sensors, Image sensors, Imaging systems, Infrared imaging, Infrared radiation, Metals

Proceedings Article | 5 October 2015 Presentation
Martin Pralle, James Carey, Thomas Joy, Chris Vineis, Chintamani Palsule
Proceedings Volume 9555, 95550D (2015) https://doi.org/10.1117/12.2190366
KEYWORDS: Near infrared, Silicon, Quantum efficiency, Absorption, Infrared imaging, Digital imaging, CMOS sensors, Laser applications, Standards development, Image processing

Proceedings Article | 26 May 2015 Paper
M. Pralle, J. Carey, C. Vineis, C. Palsule, J. Jiang, T. Joy
Proceedings Volume 9451, 945108 (2015) https://doi.org/10.1117/12.2177006
KEYWORDS: Silicon, Sensors, Infrared imaging, Cameras, Image sensors, Quantum efficiency, CMOS sensors, Infrared radiation, CCD image sensors, Imaging systems

Proceedings Article | 11 June 2013 Paper
M. Pralle, J. Carey, Homayoon Haddad, C. Vineis, J. Sickler, X. Li, J. Jiang, F. Sahebi, C. Palsule, J. McKee
Proceedings Volume 8704, 870407 (2013) https://doi.org/10.1117/12.2015959
KEYWORDS: Silicon, Sensors, Infrared radiation, Infrared imaging, CMOS sensors, Visible radiation, Image sensors, Charge-coupled devices, Quantum efficiency, Imaging systems

Showing 5 of 18 publications
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