Dr. Mengyang Li
at Sichuan Univ
SPIE Involvement:
Author
Publications (5)

PROCEEDINGS ARTICLE | October 24, 2017
Proc. SPIE. 10462, AOPC 2017: Optical Sensing and Imaging Technology and Applications
KEYWORDS: Fringe analysis, Metrology, Deflectometry, Phase measurement

PROCEEDINGS ARTICLE | October 19, 2016
Proc. SPIE. 10155, Optical Measurement Technology and Instrumentation
KEYWORDS: Metrology, Optical testing, Deflectometry, Machine vision

PROCEEDINGS ARTICLE | October 19, 2016
Proc. SPIE. 10155, Optical Measurement Technology and Instrumentation
KEYWORDS: Metrology, Interferometry, Reconstruction algorithms, Phase measurement, Wavefront reconstruction

PROCEEDINGS ARTICLE | August 7, 2015
Proc. SPIE. 9623, 2015 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
KEYWORDS: Sensors, Wavefront sensors, Wavefronts, Computer simulations, Optical testing, Reconstruction algorithms, Wavefront reconstruction, Chemical elements, Iterative methods, Evolutionary algorithms

PROCEEDINGS ARTICLE | June 22, 2015
Proc. SPIE. 9525, Optical Measurement Systems for Industrial Inspection IX
KEYWORDS: Fringe analysis, Interferometers, Calibration, Error analysis, Interferometry, Wavefronts, Zernike polynomials, Wavefront reconstruction, Near field optics, Shearing interferometers

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