Prof. Paul H. Fuoss
at Argonne National Lab
SPIE Involvement:
Author
Publications (5)

PROCEEDINGS ARTICLE | May 23, 2017
Proc. SPIE. 10237, Advances in X-ray Free-Electron Lasers Instrumentation IV
KEYWORDS: Photodetectors, Light sources, Speckle, Scattering, Spectroscopy, X-rays, Nondestructive evaluation, Dynamic light scattering, Free electron lasers, X-ray characterization, Visibility

PROCEEDINGS ARTICLE | October 17, 2012
Proc. SPIE. 8504, X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications
KEYWORDS: Sensors, Crystals, X-rays, Laser scattering, Dynamic light scattering, Speckle pattern, Laser crystals, Hard x-rays, Free electron lasers, Liquid crystal lasers

PROCEEDINGS ARTICLE | September 15, 2007
Proc. SPIE. 6717, Optomechatronic Micro/Nano Devices and Components III
KEYWORDS: Cameras, Glasses, Tungsten, Coating, Surface roughness, 3D metrology, Aspheric lenses, Precision glass molding, Glass molding, Lens grinding

PROCEEDINGS ARTICLE | September 2, 1992
Proc. SPIE. 1676, Advanced Semiconductor Epitaxial Growth Processes and Lateral and Vertical Fabrication
KEYWORDS: Scattering, Luminescence, X-rays, Gallium arsenide, Laser scattering, Chemical reactions, Synchrotron radiation, Arsenic, X-ray fluorescence spectroscopy, Absorption

PROCEEDINGS ARTICLE | October 1, 1990
Proc. SPIE. 1285, Growth of Semiconductor Structures and High-Tc Thin Films on Semiconductors
KEYWORDS: Semiconductors, Oxides, Data modeling, Scattering, X-rays, Gallium arsenide, Hydrogen, Epitaxy, Natural surfaces, Vapor phase epitaxy

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