Yanwen Sun
Student at SLAC National Accelerator Lab
SPIE Involvement:
Publications (4)

Proceedings Article | 24 April 2019 Presentation + Paper
Matthew Seaberg, Andrew Aquila, Mengning Liang, Hae Ja Lee, Bob Nagler, Yanwei Liu, Anne Sakdinawat, Frank Seiboth, Mikako Makita, Yanwen Sun, Riccardo Signorato, Sergio Carbajo, Yiping Feng, Jacek Krzywinski, Diling Zhu, Sébastien Boutet
Proceedings Volume 11038, 110380L (2019) https://doi.org/10.1117/12.2526647
KEYWORDS: Mirrors, Scanning electron microscopy, Monochromatic aberrations, X-ray imaging, Sensors, Optical microscopes, X-rays, Calibration, Interferometry

Proceedings Article | 24 April 2019 Presentation + Paper
Peihao Sun, Yanwen Sun, Diling Zhu, Sanghoon Song, Haoyuan Li, Matthieu Chollet, Matthew Seaberg, Jerome Hastings, Aymeric Robert, Mark Sutton, Yiping Feng
Proceedings Volume 11038, 1103803 (2019) https://doi.org/10.1117/12.2522912
KEYWORDS: X-rays, Free electron lasers, Stochastic processes, X-ray lasers, Electrons, X-ray imaging, Spatial coherence, Dynamic light scattering, Diagnostics, Neural networks

Proceedings Article | 14 June 2017 Presentation + Paper
Diling Zhu, Yanwen Sun, Donald Schafer, Hongliang Shi, Justin James, Karl Gumerlock, Ted Osier, Randy Whitney, Lin Zhang, Josep Nicolas, Brian Smith, Andrew Barada, Aymeric Robert
Proceedings Volume 10237, 102370R (2017) https://doi.org/10.1117/12.2265171
KEYWORDS: Scattering, X-rays, Crystals, Hard x-rays, Free electron lasers, Light sources, X-ray optics, Dynamic light scattering, Picosecond phenomena, Femtosecond phenomena, Light scattering

Proceedings Article | 23 May 2017 Presentation + Paper
Yanwen Sun, Diling Zhu, Sanghoon Song, Franz-Josef Decker, Mark Sutton, Karl Ludwig, Wojciech Roseker, Gerhard Grübel, Stephan Hruszkewycz, G. Brian Stephenson, Paul Fuoss, Aymeric Robert
Proceedings Volume 10237, 102370N (2017) https://doi.org/10.1117/12.2265454
KEYWORDS: X-rays, Scattering, Dynamic light scattering, Speckle, Free electron lasers, Spectroscopy, Light sources, Nondestructive evaluation, Photodetectors, Visibility, X-ray characterization

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