Dr. Ricardo Legarda-Sáenz
Researcher at Univ Autónoma de Yucatán
Area of Expertise:
Scientific computing , Camera calibration , Fringe processing , Parallel computing
Profile Summary

My principal research interest is the applications of optical shape measurement for the evaluation of complex objects. At present, I am working in the calibration and measurement of a fringe projection system, and the measured data matching from different views and/or different devices. Secondary interests are the processing of fringe patterns using inverse-problems approach, and applications with moire deflectometry. In these topics, papers were published in peer-review journals.
Publications (12)

PROCEEDINGS ARTICLE | September 6, 2017
Proc. SPIE. 10410, Unconventional and Indirect Imaging, Image Reconstruction, and Wavefront Sensing 2017
KEYWORDS: Light sources, 3D image reconstruction, Cameras, Reflectivity, Linear filtering, 3D modeling, Machine vision, Reconstruction algorithms, 3D vision, 3D image processing

PROCEEDINGS ARTICLE | September 12, 2014
Proc. SPIE. 9219, Infrared Remote Sensing and Instrumentation XXII
KEYWORDS: Modulation, Digital filtering, Phase shift keying, Linear filtering, Gaussian filters, 3D metrology, Projection systems, Picosecond phenomena, Binary data, Phase shifts

PROCEEDINGS ARTICLE | September 19, 2013
Proc. SPIE. 8867, Infrared Remote Sensing and Instrumentation XXI
KEYWORDS: Refractive index, Fringe analysis, Cameras, Image processing, Wavefronts, Distortion, CCD cameras, LCDs, Phase measurement, Phase shifts

PROCEEDINGS ARTICLE | September 19, 2013
Proc. SPIE. 8867, Infrared Remote Sensing and Instrumentation XXI
KEYWORDS: Optical components, Prisms, Modulation, Interferometers, Wavefronts, Control systems, Phase measurement, Wavefront reconstruction, Electroluminescent displays, Shearing interferometers

PROCEEDINGS ARTICLE | November 3, 2011
Proc. SPIE. 8011, 22nd Congress of the International Commission for Optics: Light for the Development of the World
KEYWORDS: Software, Fringe analysis, Visualization, Graphics processing units, Fourier transforms, Phase shift keying, Computer programming, Data processing, 3D metrology, Algorithm development

SPIE Journal Paper | April 1, 2011
OE Vol. 50 Issue 04
KEYWORDS: Wavefronts, Fourier transforms, Wavefront reconstruction, Signal to noise ratio, Deflectometry, Optical engineering, Fringe analysis, Data modeling, Interference (communication), Optical instrument design

Showing 5 of 12 publications
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