Mr. Scott D. Sitzman
Applications Scientist at Aerospace Corp
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | July 21, 2004
Proc. SPIE. 5392, Testing, Reliability, and Application of Micro- and Nano-Material Systems II
KEYWORDS: Thin films, Diffraction, Statistical analysis, Metals, Crystals, Copper, Ceramics, Scanning electron microscopy, Chemical analysis, Crystallography

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Back to Top