Scott D. Sitzman
Applications Scientist at Aerospace Corp
SPIE Involvement:
Author
Publications (2)

PROCEEDINGS ARTICLE | June 5, 2018
Proc. SPIE. 10691, Advances in Optical Thin Films VI
KEYWORDS: Mirrors, Corrosion, Silver, Interfaces, Reflectivity, Chromium, Photomicroscopy, Transmission electron microscopy, Nickel, Chemical analysis

PROCEEDINGS ARTICLE | July 21, 2004
Proc. SPIE. 5392, Testing, Reliability, and Application of Micro- and Nano-Material Systems II
KEYWORDS: Scanning electron microscopy, Crystals, Diffraction, Statistical analysis, Thin films, Chemical analysis, Ceramics, Crystallography, Copper, Metals

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