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Seonghyeon Oh
PhD Student at Yonsei Univ
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Publications (1)
SPIE Journal Paper | 25 August 2014
Thickness measurements of metal thin films with a plasmonic near-field scanning nanoscope using a resonant ridge aperture
Taekyong Lee, Seonghyeon Oh, Jae Hahn
JNP, Vol. 8, Issue 01, 083075, (August 2014) https://doi.org/10.1117/12.10.1117/1.JNP.8.083075
KEYWORDS: Metals, Thin films, Gold, Plasmonics, Near field, Near field scanning optical microscopy, Quartz, Atomic force microscopy, Near field optics, Aluminum
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