CONFERENCE PROCEEDINGS
Advanced Search
Steven P. Floeder
Senior Specialist Research Engineer at 3M Co
SPIE Involvement:
Author
Publications (3)
Proceedings Article | 21 March 2000 Paper
Detection probability evaluation of an automated inspection system
Wenyuan Xu, Steven Floeder
Proceedings Volume 3966, (2000) https://doi.org/10.1117/12.380067
KEYWORDS: Modulation transfer functions, Point spread functions, Aluminum, Inspection, Defect detection, Detection and tracking algorithms, Image resolution, Contrast transfer function, Printing, Transparency
Proceedings Article | 8 March 1999 Paper
Industrial web inspection for manufacturing process understanding and control
Wenyuan Xu, Steven Floeder
Proceedings Volume 3652, (1999) https://doi.org/10.1117/12.341143
KEYWORDS: Inspection, Process control, Image processing, Manufacturing, Defect detection, Control systems, Data processing, Sensors, Signal detection, Machine vision
Proceedings Article | 1 March 1991 Paper
Toward low-cost real-time EPLD-based machine vision workstations and target systems
Proceedings Volume 1386, (1991) https://doi.org/10.1117/12.47707
KEYWORDS: Logic, Image processing, Machine vision, Binary data, System integration, Computing systems, Logic devices, Computer vision technology, Clocks, Computer architecture
Conference Committee Involvement (13)
Image Processing: Machine Vision Applications VIII
10 February 2015 | San Francisco, California, United States
Image Processing: Machine Vision Applications VII
3 February 2014 | San Francisco, California, United States
Image Processing: Machine Vision Applications VI
5 February 2013 | Burlingame, California, United States
Image Processing: Machine Vision Applications V
25 January 2012 | Burlingame, California, United States
Image Processing: Machine Vision Applications IV
25 January 2011 | San Francisco Airport, California, United States
Showing 5 of 13 Conference Committees
LOAD MORE
SIGN IN TO:
  • View contact details
UPDATE YOUR PROFILE
Is this your profile? Update it now.
Sign into your SPIE.org account
Don’t have a profile and want one?
Create an account on SPIE.org
Advertisement
Advertisement
Back to Top